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目錄:賽默飛電子顯微鏡>>透射電子顯微鏡（TEM）>> 200KV透射電鏡Spectra 200 TEM

200KV透射電鏡Spectra 200 TEM
  • 200KV透射電鏡Spectra 200 TEM
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200KV透射電鏡Spectra 200 TEM
使用無(wú)邊緣效應(yīng)成像 (FFI) 可在每個(gè)樣品區(qū)采集更多的圖像，從而提高了圖片采集的日產(chǎn)出。 聽(tīng)聽(tīng) FFI 如何幫助 Elizabeth Villa 博士實(shí)驗(yàn)室的日常研究。

200KV透射電鏡Spectra 200 TEM

200KV透射電鏡Spectra 200 TEM High throughput TEM and STEM microscope for all materials science applications

Key Features


 Powered by the ultra-high-brightness cold field emission gun (X-CFEG)
 High-resolution STEM imaging performance for all accelerating voltages

High-angle annular dark-field (HAADF) images of GaN and silicon.

 Unprecedented sensitivity with the Panther STEM detection system
 Advanced STEM imaging capabilities


Electron microscope pixel array detector (EMPAD) image of MoS2.


 New possibilities in STEM analytics with Spectra 200 S/TEM

Specifications

Spectra 200 (S)TEM

  • Probe corrector:

    • Energy spread: 0.4 eV

    • Information limit: 110 pm

    • STEM resolution: 60 pm (136 pm @ 30 kV)

  • Uncorrected:

    • Energy spread: 0.4 eV

    • Information limit: 110 pm

    • STEM resolution: 164 pm

Source

  • X-CFEG: Ultra-high-brightness cold field emission gun with energy resolution of <0.4 eV

  • Flexible high-tension range from 30 – 200 kV

Analytics and detectors

  • Super-X/Dual-X EDS options, integrated software, and the Gatan Ultrafast EELS/DualEELS options together provide up to 1000 sp/s of simultaneous EDS and EELS data acquisition

  • Analytics for live peak identification and background fitting during ultra-fast EDS acquisition

  • Symmetric EDS detector design allows for combined tomographic EDS

Available detector options

  • HAADF detector

  • On-axis solid state, 8 segmented BF and ADF detectors (16 segments in total)

  • Thermo Scientific Ceta 16M Camera (optionally with speed enhancement)

  • Gatan OneView/OneView IS cameras

  • Gatan energy filter series

  • Electron microscope pixel array detector (EMPAD)



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